Smart Gate Drive technology in TI motor drivers helps customers solve their radiated EMI issues without costly board revisions or extra test time.
Introduction
Radiated emissions testing for electromagnetic interference (EMI) can reveal issues that send engineers back to the drawing board to revise their product. Design revisions and additional test time increase product costs and delay schedules while engineers debug and solve EMI issues.
Smart Gate Drive technology in TI motor drivers helps customers solve their radiated EMI issues without costly board revisions or extra test time. With selectable IDRIVE currents for driving external FETs, EMI emissions from the motor-driver section of a system can be minimized by a simple serial interface (SPI) command or resistor change.